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Line & Spot & Map Analysis

Electron Probe Micro Analyser (EPMA)

Submitted by ajoy on Thu, 08/19/2010 - 11:31
Area Linked to: 
Materials Characterization
Research Area: 
Microstructural Characterization

Electron Probe Micro Analyser (EPMA) at NML was installed in the year July, 2010. JXA-8230, JEOL, Japan, the fifth generation of Super Probes, is a high resolution, highly stable wavelength dispersive X-ray spectrometers (WDS) /energy dispersive (EDS) analyser. It can analyse elements both qualitative and quantitatively. Depending on requirement W and LaB6 filament can be used. Point, line and area analyses are possible, also elemental distribution can be identified by map analysis. The minimum probe size is 0.5 micron.

Equipment Info
Resolution & Range: 
Boron to Uranium elements. The minimum probe size is 0.5 micron.
Applications: 
Micro elemental analysis of interface, inclusions, coating, ores and minerals, metal-slags
Sample type: 
Materials other than Natural products and Polymers and polymer composites. Metallographically polished 20mm diameter either whole or mounted on Cu compacted mould
Model & Make: 
JXA-8230, JEOL, Japan
Equipment Code: 
MTC/05
Year of Installation: 
2010
Inventory No: 
20101041
PIR holder: 
Dr. Ajoy Kumar Ray

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