VE-AFM

Scanning Probe Microscope at NML was installed in the year 2004. It works at ambient conditions, is mounted on a vibration free table and has vibration proof chamber to reduce noise. The tip vibrations are monitored by a laser diode based detection system.
There are seven different modes of operations for capturing images of the surfaces of solid samples by Scanning Probe Microscope (SPM). Atomic Force Microscope (AFM), Deflection Force Microscope (DFM), Magnetic Force Microscope (MFM), Visco-Elasticity Atomic Force Microscope(VE-AFM), Visco-Elasticity- Dynamic Force Microscope(VE-DFM), Scanning Tunneling Microscope(STM) and Electro Chemical- Scanning Tunneling Microscope(EC-STM) are these modes which require appropriate selection of probes for capturing vary high resolution images. Two scanners are available: 20 and 100µm which scans down to atomic resolution.