Hitachi VP S-3400N Scanning Electron Microscope

Area Linked to: 
Materials Characterization
Research Area: 
Microstructural Characterization

The S-3400N offers advances in automation including full filament saturation and "no touch" objective aperture alignment. A new analytical chamber provides high take off angle ports for EDS and EBSD. A BSE detector allows TV rate scanning and high resolution imaging. Hitachi's patented Quad variable gun bias and SE accelerator plate ensures high currents for low voltage applications.Variable chamber pressure allows charge-up free observation of any sample without special preparation techniques such as coating. This SEM is in operation at NML from December 2005.

Equipment Info
Equipment Code: 

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