Photon X-ray light (XPS)

ESCA system at NML was installed in the year 2009. The spectrometer measures the kinetic energy (binding energy) of the ejected electron due to incident photon (X-ray light (XPS), Ultraviolet light (UPS), or Auger electron (AES), which leads to the identification of various elements and oxidation states of elements of the surface (1 – 10 nm usually). XPS measurements can be carried using three different sources; monochromatic Al K-alpha and non monochromatic Mg K-alpha and Ag K-alpha in the temperature range of 100 – 900 K. Besides, XPS has option for the in-situ depth profile measurement. UPS can be used to characterize valence band of electronic materials at and below room temperature.