HITACHI S-3400N Scanning Electron Microscope

The HITACHI S-3400N SEM is used for low to medium magnification studies of a variety of specimens; starting from failure analysis to micro-compositional analysis. Samples of all shapes, sizes and types can be examined using the SEM and it the most heavily used microscope in the laboratory. This SEM is in operation at NML from January 2006.
Technical Specifications/Features:
• Variable accelerating voltage: 200 to 30,000V
• Variable probe current: 1x10E-8 to 1x10E-12 Amps
• Maximum sample size: 127 mm
• Working distances: 5 to 65mm
• Sample rotation: 360º
• Sample tilting: -20 to + 90º
• Variable magnification: 10x to 300,000x
• Maximum resolution: 3 nm
• Detectors: ET Secondary Electron (SE), Solid state, Backscattered Electron (BSE) detectors and Energy Dispersive X-ray Spectrometry (EDS),HKL-EBSD Detector.
• Equipped with Thermo NORAN EDS capable of detecting Ba to U and forming X-ray maps/line of composition; composition to within 0.1 wt%
• Integrated digital imaging system