HITACHI S-3400N Scanning Electron Microscope

Area Linked to: 
Materials Characterization
Research Area: 
Microstructural Characterization

The HITACHI S-3400N SEM is used for low to medium magnification studies of a variety of specimens; starting from failure analysis to micro-compositional analysis. Samples of all shapes, sizes and types can be examined using the SEM and it the most heavily used microscope in the laboratory. This SEM is in operation at NML from January 2006.
Technical Specifications/Features:
• Variable accelerating voltage: 200 to 30,000V
• Variable probe current: 1x10E-8 to 1x10E-12 Amps
• Maximum sample size: 127 mm
• Working distances: 5 to 65mm
• Sample rotation: 360º
• Sample tilting: -20 to + 90º
• Variable magnification: 10x to 300,000x
• Maximum resolution: 3 nm
• Detectors: ET Secondary Electron (SE), Solid state, Backscattered Electron (BSE) detectors and Energy Dispersive X-ray Spectrometry (EDS),HKL-EBSD Detector.
• Equipped with Thermo NORAN EDS capable of detecting Ba to U and forming X-ray maps/line of composition; composition to within 0.1 wt%
• Integrated digital imaging system

Equipment Info
Resolution & Range: 
• Variable magnification: 10x to 300,000x
High resolution microscopy
Sample type: 
Maximum sample size: 100 mm; Maximum resolution: 4 nm
Model & Make: 
Equipment Code: 
Year of Installation: 
PIR holder: 
Dr. Swapan Kumar Das

Theme by Danetsoft and Danang Probo Sayekti inspired by Maksimer